DocumentCode :
3456915
Title :
CMOS-MEMS dynamic FM atomic force microscope
Author :
Sarkar, Niladri ; Lee, Gene ; Mansour, Raafat R.
Author_Institution :
Univ. of Waterloo, Waterloo, ON, Canada
fYear :
2013
fDate :
16-20 June 2013
Firstpage :
916
Lastpage :
919
Abstract :
We present the first imaging results with a dynamic FM-AFM (frequency modulation atomic force microscope) on a chip. This instrument does not require any off-chip scanning hardware or position sensors. The CMOS-MEMS dynamic FM-AFM includes 3-D electrothermal actuation, 3-axis position sensing, and a flexural resonant cantilever with balanced piezoresistive detection, all integrated on a single chip. Several design principles are applied to reduce the instrument´s sensitivity to electrical and thermal coupling effects. To the best of the authors´ knowledge, this is the first integrated dynamic FM-AFM that can image a sample independently.
Keywords :
CMOS integrated circuits; atomic force microscopy; cantilevers; frequency modulation; microactuators; micropositioning; microsensors; piezoresistive devices; 3-D electrothermal actuation; 3-axis position sensing; CMOS-MEMS dynamic FM-AFM; electrical coupling effects; flexural resonant cantilever; frequency modulation atomic force microscope; piezoresistive detection; thermal coupling effects; Actuators; Atomic force microscopy; Dynamics; Force; Probes; Sensors; AFM; Atomic Force Microscope; CMOS-MEMS; FM-AFM; cantilever; electrothermal actuator; nanopositioning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on
Conference_Location :
Barcelona
Type :
conf
DOI :
10.1109/Transducers.2013.6626917
Filename :
6626917
Link To Document :
بازگشت