DocumentCode
3456951
Title
Input variable selection for neural networks: application to predicting the U.S. business cycle
Author
Utans, Joachim ; Moody, John ; Rehfuss, Steve ; Siegelmann, Hava
Author_Institution
Dept. of Comput. Sci. & Eng., Oregon Graduate Inst., Portland, OR, USA
fYear
1995
fDate
9-11 Apr 1995
Firstpage
118
Lastpage
122
Abstract
Selecting a “best subset” of input variables is a critical issue in forecasting. This is especially true when the number of available input series is large, and an exhaustive search through all combinations of variables is computationally infeasible. Inclusion of irrelevant variables not only doesn´t help prediction, but can reduce forecasting accuracy through added noise or systematic bias. We demonstrate a technique called “sensitivity-based pruning” (SBP) that removes irrelevant input variables from a nonlinear forecasting or regression model. The technique makes use of a saliency measure computed for each input variable and uses estimates of prediction risk for determining the number of input variables to prune. We present preliminary results of the SBP technique applied to neural network predictors of a key business cycle measure, the US Index of Industrial Production
Keywords
business data processing; commerce; economics; forecasting theory; neural nets; production; search problems; sensitivity; US Index of Industrial Production; US business cycle prediction; best subset selection; forecasting accuracy; input series; input variable selection; input variables pruning; irrelevant variables; neural network predictors; noise; nonlinear forecasting model; prediction risk estimates; regression model; saliency measure; sensitivity-based pruning; systematic bias; Application software; Economic forecasting; Economic indicators; Industrial economics; Input variables; Macroeconomics; Neural networks; Predictive models; Production; Time series analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence for Financial Engineering, 1995.,Proceedings of the IEEE/IAFE 1995
Conference_Location
New York, NY
Print_ISBN
0-7803-2145-6
Type
conf
DOI
10.1109/CIFER.1995.495263
Filename
495263
Link To Document