DocumentCode :
3456951
Title :
Input variable selection for neural networks: application to predicting the U.S. business cycle
Author :
Utans, Joachim ; Moody, John ; Rehfuss, Steve ; Siegelmann, Hava
Author_Institution :
Dept. of Comput. Sci. & Eng., Oregon Graduate Inst., Portland, OR, USA
fYear :
1995
fDate :
9-11 Apr 1995
Firstpage :
118
Lastpage :
122
Abstract :
Selecting a “best subset” of input variables is a critical issue in forecasting. This is especially true when the number of available input series is large, and an exhaustive search through all combinations of variables is computationally infeasible. Inclusion of irrelevant variables not only doesn´t help prediction, but can reduce forecasting accuracy through added noise or systematic bias. We demonstrate a technique called “sensitivity-based pruning” (SBP) that removes irrelevant input variables from a nonlinear forecasting or regression model. The technique makes use of a saliency measure computed for each input variable and uses estimates of prediction risk for determining the number of input variables to prune. We present preliminary results of the SBP technique applied to neural network predictors of a key business cycle measure, the US Index of Industrial Production
Keywords :
business data processing; commerce; economics; forecasting theory; neural nets; production; search problems; sensitivity; US Index of Industrial Production; US business cycle prediction; best subset selection; forecasting accuracy; input series; input variable selection; input variables pruning; irrelevant variables; neural network predictors; noise; nonlinear forecasting model; prediction risk estimates; regression model; saliency measure; sensitivity-based pruning; systematic bias; Application software; Economic forecasting; Economic indicators; Industrial economics; Input variables; Macroeconomics; Neural networks; Predictive models; Production; Time series analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence for Financial Engineering, 1995.,Proceedings of the IEEE/IAFE 1995
Conference_Location :
New York, NY
Print_ISBN :
0-7803-2145-6
Type :
conf
DOI :
10.1109/CIFER.1995.495263
Filename :
495263
Link To Document :
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