DocumentCode :
3456994
Title :
Second-harmonic generation from silicon nanocrystals embedded in SiO/sub 2/
Author :
Jiang, Y. ; Wilson, P.T. ; Downer, M.C. ; White, C.W. ; Withrow, S.P.
Author_Institution :
Dept. of Phys., Texas Univ., Austin, TX, USA
fYear :
2001
fDate :
11-11 May 2001
Firstpage :
552
Lastpage :
553
Abstract :
Summary form only given. Si nanocrystals (ncs) embedded in SiO/sub 2/ are an essential ingredient of a new class of flash memory devices, and show promise as a nonlinear optical material for photonic device applications. We report an optical second-harmonic generation (SHG) study of nc-Si/SiO/sub 2/ nanocomposites. The results show that SHG from nc-Si/SiO/sub 2/ is sensitive to Si/SiO/sub 2/ electronic interface states and to electrostatic charging of the Si ncs, both essential features in their role in electronic device operation. SHG is also sensitive to transverse gradients in nc density, an essential feature in the design of photonic structures. Thus SHG uniquely characterizes materials and devices based on nc-Si/SiO/sub 2/.
Keywords :
elemental semiconductors; interface states; nanostructured materials; optical harmonic generation; refractive index; semiconductor quantum dots; silicon; SHG coherence lengths; Si-SiO/sub 2/; absorption spectra; annealing; discrete boundaries; electronic interface states; electrostatic charging; fused silica substrates; multi-photon process; nanocomposites; nonlinear optical material; optical second-harmonic generation; phase mismatch; photo-induced rise; refractive index dispersion; silica embedded silicon nanocrystals; time-dependent SHG effect; transverse density gradients; Flash memory; Interface states; Nanocomposites; Nanocrystals; Nonlinear optical devices; Nonlinear optics; Optical harmonic generation; Optical materials; Optical sensors; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-662-1
Type :
conf
DOI :
10.1109/CLEO.2001.948156
Filename :
948156
Link To Document :
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