Title :
Simulation of the non-idealities in current sharing in parallel IGBT subsystem
Author :
Paakkinen, Mikko ; Cottet, D.
Author_Institution :
Corp. Res., ABB Switzerland Ltd., Baden-Dattwil
Abstract :
The parallel connection of the power semiconductors is used to achieve higher current and higher output power. Small differences in the device characteristics can cause significant differences in the current sharing. Another well known reason for the current imbalance is the asymmetry of the paralleling impedances. These two design aspects are referenced in this paper. A simulation case study is used to illustrate the effect of differences in the power semiconductors and in the paralleling busbars. Simulation results are compared with respective experimental results.
Keywords :
insulated gate bipolar transistors; power semiconductor devices; current imbalance; current sharing; parallel IGBT subsystem; parallel connection; paralleling impedances; power semiconductors; Circuit simulation; Impedance; Inductors; Insulated gate bipolar transistors; Multichip modules; Semiconductor diodes; Snubbers; Steady-state; Threshold voltage; Visualization;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-1873-2
Electronic_ISBN :
1048-2334
DOI :
10.1109/APEC.2008.4522724