DocumentCode
3457212
Title
Simulation of the non-idealities in current sharing in parallel IGBT subsystem
Author
Paakkinen, Mikko ; Cottet, D.
Author_Institution
Corp. Res., ABB Switzerland Ltd., Baden-Dattwil
fYear
2008
fDate
24-28 Feb. 2008
Firstpage
211
Lastpage
215
Abstract
The parallel connection of the power semiconductors is used to achieve higher current and higher output power. Small differences in the device characteristics can cause significant differences in the current sharing. Another well known reason for the current imbalance is the asymmetry of the paralleling impedances. These two design aspects are referenced in this paper. A simulation case study is used to illustrate the effect of differences in the power semiconductors and in the paralleling busbars. Simulation results are compared with respective experimental results.
Keywords
insulated gate bipolar transistors; power semiconductor devices; current imbalance; current sharing; parallel IGBT subsystem; parallel connection; paralleling impedances; power semiconductors; Circuit simulation; Impedance; Inductors; Insulated gate bipolar transistors; Multichip modules; Semiconductor diodes; Snubbers; Steady-state; Threshold voltage; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
Conference_Location
Austin, TX
ISSN
1048-2334
Print_ISBN
978-1-4244-1873-2
Electronic_ISBN
1048-2334
Type
conf
DOI
10.1109/APEC.2008.4522724
Filename
4522724
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