• DocumentCode
    3457212
  • Title

    Simulation of the non-idealities in current sharing in parallel IGBT subsystem

  • Author

    Paakkinen, Mikko ; Cottet, D.

  • Author_Institution
    Corp. Res., ABB Switzerland Ltd., Baden-Dattwil
  • fYear
    2008
  • fDate
    24-28 Feb. 2008
  • Firstpage
    211
  • Lastpage
    215
  • Abstract
    The parallel connection of the power semiconductors is used to achieve higher current and higher output power. Small differences in the device characteristics can cause significant differences in the current sharing. Another well known reason for the current imbalance is the asymmetry of the paralleling impedances. These two design aspects are referenced in this paper. A simulation case study is used to illustrate the effect of differences in the power semiconductors and in the paralleling busbars. Simulation results are compared with respective experimental results.
  • Keywords
    insulated gate bipolar transistors; power semiconductor devices; current imbalance; current sharing; parallel IGBT subsystem; parallel connection; paralleling impedances; power semiconductors; Circuit simulation; Impedance; Inductors; Insulated gate bipolar transistors; Multichip modules; Semiconductor diodes; Snubbers; Steady-state; Threshold voltage; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-1873-2
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2008.4522724
  • Filename
    4522724