• DocumentCode
    3457304
  • Title

    RB-IGBT gate drive circuit and its application in two-stage matrix converter

  • Author

    Li, Gang ; Sun, Kai ; Huang, Lipei ; Igarashi, Seiki

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Beijing
  • fYear
    2008
  • fDate
    24-28 Feb. 2008
  • Firstpage
    245
  • Lastpage
    251
  • Abstract
    Compared with conventional direct matrix converter, two-stage matrix converter has similar input/output characteristic. Furthermore, two-stage matrix converter can be implemented and controlled much easier since it has a practical DC-link. RB-IGBT is employed to construct bi-directional switches in two-stage matrix converter, which reduces on-state voltage drop and power loss of the converter. In this paper, a gate drive circuit for RB-IGBT with short-circuit protection based on integrated chip EXB841 is proposed. Experimental results validate the good performance of the proposed circuit in terms of switching test, fault under load test and hard switching fault test. The proposed gate drive circuit has been applied to drive the RB-IGBT bi-directional switches in the rectifier stage of two-stage matrix converter. The implementation of 10 kW two-stage matrix converter prototype using RB-IGBT is presented, and the experimental results on the rectifier stage of two-stage matrix converter using RB-IGBT is shown to test the proposed gate drive circuit.
  • Keywords
    driver circuits; insulated gate bipolar transistors; matrix convertors; rectifying circuits; switching convertors; RB-IGBT gate drive circuit; bidirectional switches; direct matrix converter; fault under load test; hard switching fault test; integrated chip EXB841; onstate voltage drop; short-circuit protection; two-stage matrix converter; Bidirectional control; Circuit faults; Circuit testing; Matrix converters; Protection; Rectifiers; Switches; Switching circuits; Switching converters; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-1873-2
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2008.4522729
  • Filename
    4522729