Title :
Piezoelectrically Activated Silicon Resonators
Author :
Baborowski, J. ; Bourgeois, C. ; Pezous, A. ; Muller, C. ; Dubois, M.A.
Author_Institution :
CSEM, Neuchatel
fDate :
May 29 2007-June 1 2007
Abstract :
This paper describes the feasibility and performances of two families of AIN/Si resonators: 1 MHz extensional and 20 to 100 kHz flexural resonators. In both components the resonating structure is obtained with SOI silicon suspended beams driven by an AIN piezoelectric layer. The 1MHz resonator exhibits a Q factor larger than 100 000 under vacuum and a coupling coefficient of 0.06%. The 20 to 100kHz resonators exhibit extremely low thermal drift of resonant frequency (alpha close to zero). The thermal compensation has been obtained at device-level by using SiO2 with an appropriate thickness.
Keywords :
III-V semiconductors; Q-factor; aluminium compounds; crystal resonators; elemental semiconductors; silicon; AIN piezoelectric layer; Q factor; Si-AlN; SiO2; flexural resonator; frequency 1 MHz; frequency 20 kHz to 100 kHz; piezoelectrically activated silicon resonator; thermal compensation; Electronic packaging thermal management; Energy consumption; Fabrication; Micromechanical devices; Oscillators; Q factor; Resonant frequency; Silicon; Vibrations; Voltage;
Conference_Titel :
Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
Conference_Location :
Geneva
Print_ISBN :
978-1-4244-0646-3
Electronic_ISBN :
1075-6787
DOI :
10.1109/FREQ.2007.4319269