DocumentCode :
3457584
Title :
Determination of the limiting factors in the absolute phase noise of an L-band dielectric resonator oscillator
Author :
Mizan, M. ; McGowan, R.C. ; Lukaszek, T. ; Ballato, A.
Author_Institution :
US Army Labcom, Fort Monmouth, NJ, USA
fYear :
1991
fDate :
29-31 May 1991
Firstpage :
687
Lastpage :
692
Abstract :
In an attempt to better understand the noise performance of a state-of-the-art two-stage L-band dielectric resonator oscillator (DRO), a single-stage DRO was constructed for comparison. The results of this investigation are presented. The discussion begins with a brief analysis of the design and temperature performance of the one- and two-stage DROs. The residual and absolute phase noise performance are discussed. The measured data demonstrate the low phase noise capability and excellent frequency stability of the two-stage, 2-GHz DRO
Keywords :
dielectric resonators; frequency stability; microwave oscillators; noise; 2 GHz; L-band; UHF; absolute phase noise; dielectric resonator oscillator; frequency stability; noise performance; single-stage DRO; temperature performance; two-stage; Additive noise; Bandwidth; Circuit noise; Dielectric loss measurement; Dielectric losses; Frequency; L-band; Noise measurement; Oscillators; Phase noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control, 1991., Proceedings of the 45th Annual Symposium on
Conference_Location :
Los Angeles, CA
Print_ISBN :
0-87942-658-6
Type :
conf
DOI :
10.1109/FREQ.1991.145968
Filename :
145968
Link To Document :
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