Title :
Study of microstrip detectors
Author :
Gutierrez, P. ; Kalbfleisch, G. ; Kaplan, D. ; Kuehler, J. ; Skubic, P. ; Wood, M. ; Bullough, M. ; Lucas, A.D. ; Wilburn, C.D. ; Karchin, P. ; Liapis, C. ; Sinnott, J. ; McCliment, E.
Author_Institution :
Oklahoma Univ., Norman, OK, USA
Abstract :
Single- and double-sided AC-coupled detectors and double-sided DC-coupled detectors read out with the Berkeley SVXD chip are being studied. The authors report on the signal and noise characteristics for typical single channels and the channel-to-channel variations in noise, gain, and pedestal values. Because collider detectors encounter tracks at all angles of incidence, the authors studied the response of the prototypes over a wide range of angles to see whether the cluster size and charge sharing properties of the various detectors are different. For angles at approximately 0 degrees , the resolution of the double-sided detector is 4.5 mu m on the ohmic side and 3.5 mu m for the single-sided AC coupled detector. The signal-to-noise ratio for the double-sided detector is 25:1, while for the single-sided detector it is 38:1.<>
Keywords :
position sensitive particle detectors; semiconductor counters; SVXD chip; Si microstrip detectors; channel-to-channel variations; charge sharing properties; cluster size; collider detectors; double-sided AC-coupled detectors; double-sided DC-coupled detectors; gain; noise characteristics; pedestal values; signal-to-noise ratio; single-sided AC coupled detector; Bonding; Detectors; Manufacturing; Microstrip; Semiconductor device manufacture; Silicon; Spatial resolution; Strips; Testing; Wire;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
Conference_Location :
Santa Fe, NM, USA
Print_ISBN :
0-7803-0513-2
DOI :
10.1109/NSSMIC.1991.258969
