DocumentCode
3457948
Title
PMOSFET-Type Photodetector with High Responsivity for CMOS Image Sensor
Author
Seo, Sang-Ho ; Kim, Kyung-Do ; Shin, Jang-Kyoo ; Cho, Youze ; Park, Hong-Bae ; Choi, Pyung
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Daegu
fYear
2006
fDate
20-23 Aug. 2006
Firstpage
871
Lastpage
876
Abstract
In this paper, a new photodetector using a PMOSFET-type photodetector with a transfer gate has been designed and fabricated using a 0.35 mum standard CMOS technology. The photodetector is composed of a floating gate that is tied to an n-well and a transfer gate. The transfer gate controls the photocurrent flow by controlling the barrier for holes in the PMOSFET-type photodetector. The designed photodetector has similar Ids-Vds characteristics as those of a general PMOSFET when the incident light power, instead of the gate voltage, is varied. The area of the proposed photodetector is 3.8 mum times 5.7 mum and the responsivity is larger than 2.7 times 102 AAV at a wavelength of 632.8 nm.
Keywords
CMOS image sensors; MOSFET; photoconductivity; photodetectors; CMOS image sensor; Ids-Vds characteristics; PMOSFET; floating gate; photocurrent flow; photodetector; size 3.8 mum; size 5.7 mum; transfer gate; wavelength 632.8 nm; CMOS image sensors; CMOS process; CMOS technology; Computational Intelligence Society; Dynamic range; MOSFET circuits; Photoconductivity; Photodetectors; Silicon on insulator technology; Voltage; PMOSFET; photodetector; transfer gate;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Acquisition, 2006 IEEE International Conference on
Conference_Location
Shandong
Print_ISBN
1-4244-0528-9
Electronic_ISBN
1-4244-0529-7
Type
conf
DOI
10.1109/ICIA.2006.305848
Filename
4097781
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