DocumentCode
3457985
Title
Steganalysis Algorithm Based on the D Reduction of Improved Differential Matrix in Images
Author
Yu, Wenqiong ; Li, Zhuo ; Ping, Lingdi
Author_Institution
Math. & Comput. Sci., Sanming Univ., Sanming, China
fYear
2010
fDate
21-23 Oct. 2010
Firstpage
1
Lastpage
7
Abstract
Aimed to improve the detection efficiency of information-hiding blind detection system, the present study proposes an SADRID-I image steganalysis algorithm that is based on improved differential matrix, according to the high dimensions and correlation of image features. Using attribute significance and differential matrix that stems from rough sets theory, the algorithm can implement D attributes reduction to high dimensional statistic features extracted from test image to get more accurate rough features. By screening and extraction, it reduces feature dimension and computational complexity, and correlations between eigenvectors are scientifically counteracted, with an improvement in detection efficiency of information-hiding blind detection system. Using the proposed algorithm to reducte the statistical features extracted from different image databases, image formats and different scales, and SVM classifier employed in the tests of detecting Steganographic tools such as Cox, Piva, jphide, MB1 and MB2, etc, a large body of experimental results indicate that SADRID-I steganalysis algorithm has better universality, stability and effectiveness while it gets significant improvement in space efficiency, time efficiency, feature accuracy, etc.
Keywords
computational complexity; differential equations; eigenvalues and eigenfunctions; feature extraction; image processing; rough set theory; security of data; steganography; D reduction; SVM classifier; blind detection system; computational complexity; correlation; eigenvector; feature dimension; image database; image format; image steganalysis algorithm; improved differential matrix; information hiding; matrix image feature; rough set theory; statistic feature extraction; steganographic tool detection; Algorithm design and analysis; Classification algorithms; Feature extraction; Image databases; Set theory; Wavelet domain;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (CCPR), 2010 Chinese Conference on
Conference_Location
Chongqing
Print_ISBN
978-1-4244-7209-3
Electronic_ISBN
978-1-4244-7210-9
Type
conf
DOI
10.1109/CCPR.2010.5659244
Filename
5659244
Link To Document