• DocumentCode
    3458246
  • Title

    A New Connectivity-Based Cluster Validity Index

  • Author

    Zhang, Shangchao ; Yu, Jian

  • Author_Institution
    Sch. of Comput. & Inf. Technol., Beijing Jiaotong Univ., Beijing, China
  • fYear
    2010
  • fDate
    21-23 Oct. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Many cluster validity indices faced two problems. First, most of them neglect the variance of intra-cluster compactness between clusters. Second, some indices can not deal well with the clusters of arbitrary shapes. In this paper, we propose a new approach to solving these two problems: we define the validity indices for the whole clustering results upon the validity indices of single clusters. This idea can help indices deal with clusters of different intra-cluster compactness. After that, we take advantage of connect distance and propose a new connectivity-based cluster validity index which can deal with the clusters of arbitrary shapes. The experiment results show its effectiveness.
  • Keywords
    pattern clustering; statistical analysis; cluster analysis; connectivity-based cluster validity index; intra-cluster compactness; Electronic mail; Indexes; Information processing; Iris recognition; Pattern analysis; Pattern recognition; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (CCPR), 2010 Chinese Conference on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-7209-3
  • Electronic_ISBN
    978-1-4244-7210-9
  • Type

    conf

  • DOI
    10.1109/CCPR.2010.5659259
  • Filename
    5659259