Title :
Active load for burn-in test of buck-type DC-DC converter with ultra-low output voltage
Author :
Hwu, K.I. ; Yau, Y.T.
Author_Institution :
Dept. of Electr. Eng., Nat. Taipei Univ. of Technol., Taipei
Abstract :
In this paper, a nonisolated single-stage active load for burn-in test of the buck-type DC-DC converter with ultra-low output voltage is presented herein so as to realize energy recycling. The detailed illustration of this converter, together with some simulation experimental results, is provided to demonstrate the effectiveness of the proposed scheme.
Keywords :
DC-DC power convertors; buck-type DC-DC converter; burn-in test; energy recycling; nonisolated single-stage active load; ultra-low output voltage; Circuit simulation; Circuit testing; DC-DC power converters; Diodes; Field programmable gate arrays; MOSFET circuits; Switches; Switching circuits; Uninterruptible power systems; Voltage;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-1873-2
Electronic_ISBN :
1048-2334
DOI :
10.1109/APEC.2008.4522788
