Title :
The statistics of IC failures for multipulse electromagnetic irradiation
Author :
Vasilyev, K.B. ; Klyuchnik, A.V. ; Solodov, A.V.
Abstract :
The results of integrated circuit (IC) failure investigation under electromagnetic irradiation are presented. The probability of IC damage is determined as a function of number of electromagnetic pulses N and intensity of radiation. A theoretical model of the damage accumulation is presented.
Keywords :
electromagnetic pulse; failure analysis; integrated circuit reliability; probability; statistical analysis; IC damage; IC failures; damage accumulation; electromagnetic pulses; multipulse electromagnetic irradiation; probability; radiation intensity; Degradation; EMP radiation effects; Electromagnetic radiation; Electromigration; Fluctuations; Frequency; Magnetic susceptibility; Probability; Pulse width modulation; Statistics;
Conference_Titel :
Microwave Conference, 1999. Microwave & Telecommunication Technology. 1999 9th International Crimean [In Russian with English abstracts]
Conference_Location :
Sevastopol, Crimea, Ukraine
Print_ISBN :
966-572-003-1
DOI :
10.1109/CRMICO.1999.815255
