• DocumentCode
    3458593
  • Title

    Common mode EMI study and reduction technique in interleaved Multi-channel PFC

  • Author

    Kong, Pengju ; Wang, Shuo ; Wang, Chuanyun ; Lee, Fred C.

  • Author_Institution
    Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA
  • fYear
    2008
  • fDate
    24-28 Feb. 2008
  • Firstpage
    729
  • Lastpage
    735
  • Abstract
    Interleaved Multi-channel Power factor correction (PFC) converter is very popular nowadays with its ability to reduce the input and output current ripples. In this paper, common mode (CM) EMI noise emission model of multi-channel PFC is studied. Topology modification to implement balance technique is made to reduce its CM noise emission. To improve the high frequency balance, a novel topology with coupled- inductor structure is proposed. Design guideline is provided to achieve balance in practice. This topology can greatly reduce CM noise with only little changes to the original multi-channel PFC topology. Effects of phase shift and channel shedding on this solution are also studied. The proposed topology has effectively reduced CM noise under any phase shift and channel shedding condition. A two-channel PFC is built to verify the proposed balance technique. Experimental results show that CM noise is reduced up to 20 dBuV between 150 kHz and 7 MHz.
  • Keywords
    electromagnetic interference; inductors; interference suppression; power convertors; power factor correction; CM electromagnetic interference; channel shedding; common mode EMI; coupled-inductor structure; frequency 150 kHz to 7 MHz; interleaved multichannel PFC converter; noise emission model; phase shifting; power factor correction; Electromagnetic interference; Filters; Frequency; Guidelines; Noise generators; Noise reduction; Parasitic capacitance; Phase noise; Topology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-1873-2
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2008.4522802
  • Filename
    4522802