Title :
Integration of parasitic cancellation techniques for EMI filter design
Author :
Wang, Shuo ; Lee, Fred C. ; van Wyk, J.D.
Author_Institution :
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA
Abstract :
In this paper, effects of parasitic parameters on EMI filter performance are first discussed. The parasitic cancellation techniques for both self and mutual parasitics are then reviewed. The possibilities to integrate parasitic cancellation techniques into one EMI filter are analyzed. The constraints of the integration are identified. It is found that three parasitic cancellation techniques can be integrated into one EMI filter without any conflicts and compromises. Experiments are finally carried out to verify the integrated cancellation technique.
Keywords :
electromagnetic interference; power electronics; power filters; EMI filter design; mutual parasitics; parasitic cancellation techniques; Capacitors; Delta modulation; Electromagnetic interference; Filters; Inductance; Inductors; Magnetic separation; Mutual coupling; Parasitic capacitance; Power electronics;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-1873-2
Electronic_ISBN :
1048-2334
DOI :
10.1109/APEC.2008.4522803