• DocumentCode
    3458776
  • Title

    A novel protection scheme for three-level converter based on monitoring flying capacitor voltage

  • Author

    Sheng, Honggang ; Wang, Fred ; Tipton, C.W.

  • Author_Institution
    Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA
  • fYear
    2008
  • fDate
    24-28 Feb. 2008
  • Firstpage
    790
  • Lastpage
    795
  • Abstract
    This paper presents a novel protection method for three-level converters. The three-level converter is subject to voltage unbalance, which can result in switch overvoltage and system failure. This abnormal phenomenon can be detected by monitoring the voltage across the flying capacitor (Vcss). Based on simulation analysis, monitoring the Vcss is also an effective way to detect various system faults, including shoot-through. Using the Vcss as the signal for fault detection, the proposed protection scheme can improve the system reliability without any additional components on the power stage and impact on the performance. The protection method can not only protect the system against unbalanced voltage stresses on the switches, but also provide a remedy for the system as faults happen. Furthermore, under/over input voltage lockout can be replaced by the proposed protection scheme. The verification is performed by the experiment with a three-level parallel resonant converter.
  • Keywords
    DC-DC power convertors; fault diagnosis; protection; reliability; fault detection; flying capacitor voltage; protection scheme; shoot-through; switch overvoltage; system failure; three-level parallel resonant converter; unbalanced voltage stresses; Analytical models; Capacitors; Condition monitoring; Fault detection; Power system protection; Reliability; Signal detection; Switches; Switching converters; Voltage control; Three-level dc-dc converter; converter protection; flying capacitor; shoot-through;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-1873-2
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2008.4522811
  • Filename
    4522811