• DocumentCode
    3458910
  • Title

    Redundancy and diversity measure inspired biometrics fusion

  • Author

    Ramakrishnan, Veshnu ; Ratha, Nalini

  • Author_Institution
    IBM Res., Hawthorne, NY, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    61
  • Lastpage
    66
  • Abstract
    In many identification problems, finding a duplicate using biometrics is very challenging task because of the size of the database and the errors related to the core biometrics engine. Fusion of different modes of biometric system can lead to improved recognition accuracy. In a multi classifier fusion scenario, the confidence of one classifier should not only depend on its own decision confidence but also on the diffidence of other classifiers. We propose a novel solution which uses a machine learning approach to generate confidence scores for each system for every instance of decision by implicitly modelling the redundancy (all classifiers making the same decision) and diversity (each classifier making a different decision and only a subset of classifiers is right at one time)from the training data. These confidence scores are used as weights for votes and the final decision is made using weighted sum of votes. Experimental results are provided by comparing this method with more conventional methods like majority voting, and majority voting with confidence. The performance of the proposed method on NIST BSSR-1 dataset and FERET face dataset shows the efficacy of our approach measured by the accuracy improvements we are able to achieve by implicitly modelling the redundancy and diversity measures.
  • Keywords
    biometrics (access control); face recognition; image classification; image fusion; learning (artificial intelligence); biometrics fusion; confidence scores; diversity measure; machine learning approach; Biometrics; Databases; Engines; Fingerprint recognition; Fuses; Fusion power generation; Machine learning; Redundancy; Size measurement; Voting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-7029-7
  • Type

    conf

  • DOI
    10.1109/CVPRW.2010.5543230
  • Filename
    5543230