• DocumentCode
    3458957
  • Title

    Status of the silicon strip high-rate FASTBUS readout system

  • Author

    Gonzalez, H. ; Barsotti, E. ; Bowden, M. ; Christian, D. ; Chramowicz, J. ; Fachin, M. ; Haldeman, M. ; Hoff, James ; Holmes, Scott ; Rotolo, C. ; Romero, Andrew ; Slimmer, D. ; Swoboda, C. ; Trendler, R. ; Urish, J. ; Yarema, Raymond ; Zimmerman, Tom ; Z

  • Author_Institution
    Fermi Nat. Accel. Lab., Batavia, IL, USA
  • fYear
    1991
  • fDate
    2-9 Nov. 1991
  • Firstpage
    747
  • Abstract
    A system to collect and process data at high rate, 53 MHz, from a silicon microstrip detector has been developed. The system is implemented using the FASTBUS standard and modularized at the board level in 128 channel increments. The system includes the following features: zero dead time readout for average trigger rate as high as 1 MHz; pipelined triggers and event readout; programmable data delay of up to 4.8 mu s; FASTBUS system readout; histogram readout option; and multiple high-speed bipolar process ASICs (application-specific integrated circuits). A general block diagram of data flow for the SSD (silicon strip detector) readout is provided. All the modules used for the SSD readout were tested individually to satisfy single board test requirements. Attention is given to SSD hardware for E771, a fixed target experiment designed to study the production of B hadrons by an 800 GeV/c proton beam.<>
  • Keywords
    application specific integrated circuits; nuclear electronics; position sensitive particle detectors; semiconductor counters; silicon; trigger circuits; 1 MHz; 4.8 mus; B hadrons; E771; SSD; Si strip; application-specific integrated circuits; average trigger rate; block diagram; board level; channel increments; data flow; event readout; fixed target experiment; hardware; high-rate FASTBUS readout system; histogram readout; microstrip detector; multiple high-speed bipolar process ASICs; pipelined triggers; programmable data delay; proton beam; zero dead time readout; Application specific integrated circuits; Circuit testing; Delay effects; Detectors; Fastbus; Hardware; Histograms; Microstrip; Silicon; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
  • Conference_Location
    Santa Fe, NM, USA
  • Print_ISBN
    0-7803-0513-2
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1991.259041
  • Filename
    259041