DocumentCode
3458957
Title
Status of the silicon strip high-rate FASTBUS readout system
Author
Gonzalez, H. ; Barsotti, E. ; Bowden, M. ; Christian, D. ; Chramowicz, J. ; Fachin, M. ; Haldeman, M. ; Hoff, James ; Holmes, Scott ; Rotolo, C. ; Romero, Andrew ; Slimmer, D. ; Swoboda, C. ; Trendler, R. ; Urish, J. ; Yarema, Raymond ; Zimmerman, Tom ; Z
Author_Institution
Fermi Nat. Accel. Lab., Batavia, IL, USA
fYear
1991
fDate
2-9 Nov. 1991
Firstpage
747
Abstract
A system to collect and process data at high rate, 53 MHz, from a silicon microstrip detector has been developed. The system is implemented using the FASTBUS standard and modularized at the board level in 128 channel increments. The system includes the following features: zero dead time readout for average trigger rate as high as 1 MHz; pipelined triggers and event readout; programmable data delay of up to 4.8 mu s; FASTBUS system readout; histogram readout option; and multiple high-speed bipolar process ASICs (application-specific integrated circuits). A general block diagram of data flow for the SSD (silicon strip detector) readout is provided. All the modules used for the SSD readout were tested individually to satisfy single board test requirements. Attention is given to SSD hardware for E771, a fixed target experiment designed to study the production of B hadrons by an 800 GeV/c proton beam.<>
Keywords
application specific integrated circuits; nuclear electronics; position sensitive particle detectors; semiconductor counters; silicon; trigger circuits; 1 MHz; 4.8 mus; B hadrons; E771; SSD; Si strip; application-specific integrated circuits; average trigger rate; block diagram; board level; channel increments; data flow; event readout; fixed target experiment; hardware; high-rate FASTBUS readout system; histogram readout; microstrip detector; multiple high-speed bipolar process ASICs; pipelined triggers; programmable data delay; proton beam; zero dead time readout; Application specific integrated circuits; Circuit testing; Delay effects; Detectors; Fastbus; Hardware; Histograms; Microstrip; Silicon; Strips;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
Conference_Location
Santa Fe, NM, USA
Print_ISBN
0-7803-0513-2
Type
conf
DOI
10.1109/NSSMIC.1991.259041
Filename
259041
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