• DocumentCode
    3459114
  • Title

    WFF: Reliability testing and reliability enhancement of RF MEMS switches

  • Author

    Ebel, John ; Newman, Harvey ; Papapolymerou, John

  • Author_Institution
    Air Force Research Lab
  • Volume
    1
  • fYear
    2004
  • fDate
    6-11 June 2004
  • Abstract
    Start of the above-titled section of the conference proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2004 IEEE MTT-S International
  • Conference_Location
    Fort Worth, TX, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-8331-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2004.1335955
  • Filename
    1335955
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3459114