DocumentCode :
3459179
Title :
A Quartz tuning fork-based humidity sensor using Nanocrystalline Zinc oxide thin film coatings
Author :
Zhou, Xiaofeng ; Jiang, Tao ; Zhang, Jian ; Zhu, Jianzhong ; Wang, Xiaohua ; Zhu, Ziqiang
Author_Institution :
Dept. of Electr. Eng., East China Normal Univ., Shanghai
fYear :
2006
fDate :
20-23 Aug. 2006
Firstpage :
1152
Lastpage :
1157
Abstract :
This paper describes an application of quartz tuning forks (QTF) coated with nanocrystalline ZnO films used as relative humidity sensors. The nanocrystalline ZnO thin films were deposited on the QTF by sol-gel method. The film was characterized by X-Ray Diffraction (XRD) and Atomic Force Microscope (AFM) to obtain the information on the structural and morphological properties. And the humidity sensitivity characteristics of the sensors have been investigated. Ethanol and acetone interference on the sensor performance have been also tested. Sensing experiments were examined by measuring the resonance frequency shift of QTF which due to the additional mass loading. The results showed that the sensors have high humidity sensitivity, good stability, fast response time, and well reproducibility. We demonstrate here a simple and low-cost humidity sensor using the QTF
Keywords :
II-VI semiconductors; X-ray diffraction; atomic force microscopy; crystal resonators; humidity sensors; nanostructured materials; semiconductor thin films; sol-gel processing; wide band gap semiconductors; zinc compounds; AFM; QTF; X-ray diffraction; XRD; ZnO; acetone; atomic force microscopy; ethanol; nanocrystalline zinc oxide thin film coatings; quartz tuning fork-based relative humidity sensor; resonance frequency shift; sol-gel method; Atomic force microscopy; Coatings; Humidity; Sensor phenomena and characterization; Sputtering; Thin film sensors; Vibrations; X-ray diffraction; X-ray scattering; Zinc oxide; Zinc oxide thin film; humidity sensor; quartz tuning fork; relative humidity; sol-gel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Acquisition, 2006 IEEE International Conference on
Conference_Location :
Weihai
Print_ISBN :
1-4244-0528-9
Electronic_ISBN :
1-4244-0529-7
Type :
conf
DOI :
10.1109/ICIA.2006.305908
Filename :
4097841
Link To Document :
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