Title :
Multi-port measurement-based package model extraction for single-ended and differential signaling
Author :
Han, DongHo ; Kim, Joong-Ho ; Ruttan, Thomas G. ; Polka, Lesley A.
Author_Institution :
Intel Corp., Candler, AZ, USA
Abstract :
This paper presents a hybrid method that combines multi-port measurements, electromagnetic (EM) numerical tools, and extrapolation techniques for accurate characterization and modeling of an entire chip-to-chip interconnection link over tens of gigahertz (GHz) ranges. To characterize multi-line transmission lines, a frequency-dependent RLGC model was found from two-port and four-port measured scattering (S) parameters, and then the tabular W-element models were generalized for N-port models using a numerical electromagnetic (EM) field solver. As for the 3D structures, such as package vias and sockets, high-frequency test structures and fixtures were designed to obtain two-and four-port S-parameters. Again, two- and four-port limited measurement-based model were generalized to N-port three-dimensional problems using an EM tool. An entire chip-to-chip link consisting of 20-port was then generated and modeled using measurement data or measurement-based models after enforcing a certain passivity condition. Using the model, 10Gbps performances were successfully predicted for a generic chip-to-chip interconnection including only passive devices such as a CPU package, a socket, a PCB MB trace, and chipset package.
Keywords :
RLC circuits; S-parameters; extrapolation; integrated circuit interconnections; integrated circuit measurement; integrated circuit modelling; microwave integrated circuits; multiport networks; transmission lines; 10 Gbit/s; N-port 3D problems; N-port models; chip-to-chip interconnection link; differential signaling; electromagnetic numerical tools; extrapolation techniques; four-port S-parameters; four-port limited measurement-based model; four-port measured scattering parameters; frequency-dependent RLGC model; gigahertz ranges; high-frequency test structures; multiline transmission lines; multiport measurement-based package model extraction; numerical electromagnetic field solver; single-ended signalling; tabular W-element models; two-port S parameters; two-port limited measurement-based model; two-port measured scattering parameters; Electromagnetic measurements; Electromagnetic modeling; Electromagnetic scattering; Extrapolation; Frequency; Packaging; Scattering parameters; Semiconductor device measurement; Sockets; Transmission line measurements;
Conference_Titel :
Microwave Measurements Conference, 2003. Fall 2003. 62nd ARFTG
Print_ISBN :
0-7803-8195-5
DOI :
10.1109/ARFTGF.2003.1459744