• DocumentCode
    3459389
  • Title

    Reliability improvements for Cockroft-Walton high voltage multipliers

  • Author

    Budnick, J. ; Bertuccio, T. ; Kirk, K. ; Sewell, M. ; Corbin, L. ; Brown, G.

  • Author_Institution
    Cyclotron Facility, Indiana Univ., Bloomington, IN, USA
  • fYear
    1991
  • fDate
    2-9 Nov. 1991
  • Firstpage
    974
  • Abstract
    Persistent equipment failures with 50 kV Cockroft-Walton (CW) high-voltage multiplier modules have resulted in a two-year reliability improvement program to reduce downtime from failed multipliers. A complete analysis of the reliability problem was performed. Failure modes were identified, stringent component testing implemented, epoxy potting procedures studied, modifications to internal structures implemented, and lengthy burn-in testing performed on modified multipliers. Internal corona (due to nonuniform electric field intensities) and tracking (from possible internal contamination) leading to eventual multiplier failure were addressed as significant causes of multiplier failures. Modified multipliers are shown to have greatly increased reliability, leading to corresponding decreases in maintenance manpower requirements.<>
  • Keywords
    circuit reliability; electrostatic accelerators; maintenance engineering; nuclear electronics; voltage multipliers; 50 kV; Cockroft-Walton high voltage multipliers; burn-in testing; corona; downtime; epoxy potting procedures; equipment failures; failed multipliers; high-voltage multiplier modules; internal contamination; internal structures; maintenance manpower requirements; nonuniform electric field intensities; stringent component testing; tracking; two-year reliability improvement program; Acceleration; Assembly; Breakdown voltage; Cyclotrons; Electric breakdown; Laboratories; Manufacturing; Testing; Transformers; Vacuum breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
  • Conference_Location
    Santa Fe, NM, USA
  • Print_ISBN
    0-7803-0513-2
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1991.259066
  • Filename
    259066