DocumentCode
3459423
Title
Calibrated measurements of waveforms at internal nodes of MMICs with a LSNA and high impedance probes
Author
Reveyrand, Tibault ; Mallet, Alain ; Nebus, Jean-Michel ; Bossche, Marc Vanden
Author_Institution
CNES, Toulouse, France
fYear
2003
fDate
4-5 Dec. 2003
Firstpage
71
Lastpage
76
Abstract
Waveforms measurements at internal nodes of MMICs are essentials for the analysis of both operating conditions and reliability aspects. Currently, the large signal network analyser (LSNA) is the most suitable time domain measurement setup. We propose, in this paper to associate the LSNA with high impedance probes (HIPs) and to do a new calibration procedure, in order to perform measurements at internals ports of multi-cells power amplifiers. Our novel measurement setup enables an easy and fast way to get corrected time domain waveforms measurements. The HIP calibration and measurement procedures can be easily added to the original LSNA driver software. Indead, the HIPs are considered like a classical test-set through the software and do not modify the traditional use of LSNA. This work is applicated here to the characterisation of a class F amplifier at S band.
Keywords
MMIC power amplifiers; calibration; integrated circuit measurement; microwave measurement; network analysers; probes; waveform analysis; HIP calibration; LSNA; MMIC internal nodes; S band; calibrated measurements; calibration procedure; class F amplifier; high impedance probes; large signal network analyser; multi-cell power amplifiers; time domain measurement; time domain waveforms measurements; Calibration; Current measurement; Hip; Impedance measurement; MMICs; Performance evaluation; Probes; Signal analysis; Time domain analysis; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurements Conference, 2003. Fall 2003. 62nd ARFTG
Print_ISBN
0-7803-8195-5
Type
conf
DOI
10.1109/ARFTGF.2003.1459755
Filename
1459755
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