Title :
An analytical approach to determine MOSFET RF extraction uncertainties due to S parameter measurement errors
Author :
Saijets, Jan ; Åberg, Markku
Author_Institution :
VTT Inf. Technol., Finland
Abstract :
The effects of S parameter measurement errors resulting from vector network analyzer uncertainties on RF MOSFET parameter extraction are analyzed. The uncertainty effects on the MOSFET small signal equivalent circuit are studied. The lower uncertainty specifications of a high end network analyzer were used as the basis for the analysis. The results suggest that input resistance extraction is very inaccurate. Transconductance and feedback capacitance characterization can be extracted with less than 4% error at low frequencies below 2-3 GHz. Output capacitance is challenging because it can easily be 50% erroneous. Output resistance can be extracted with less than 20% error for an output real part range of 3 Ω to 1 kΩ.
Keywords :
MOSFET; S-parameters; UHF field effect transistors; equivalent circuits; 2 to 3 GHz; 3 to 1000 ohm; MOSFET RF extraction uncertainty; MOSFET equivalent circuit; RF MOSFET parameter extraction; S parameter measurement errors; feedback capacitance; high end network analyzer; input resistance extraction; network analysis; output capacitance; transconductance; uncertainty effects; uncertainty specifications; vector network analyzer uncertainty; Capacitance; Equivalent circuits; Impedance; Information analysis; MOSFET circuits; Measurement errors; Measurement uncertainty; Parameter extraction; Radio frequency; Scattering parameters;
Conference_Titel :
Microwave Measurements Conference, 2003. Fall 2003. 62nd ARFTG
Print_ISBN :
0-7803-8195-5
DOI :
10.1109/ARFTGF.2003.1459760
