Title :
Reticulant doped semiconductive epoxies and plastics for high voltage applications
Author_Institution :
Cyclotron Facility, Indiana Univ., Bloomington, IN, USA
Abstract :
Various techniques of doping epoxies and plastics for use in solving high-voltage problems associated with particle accelerators and high-voltage power supplies have been investigated. These studies have centered on two categories of dopants: antistatic additives and the organic charge-transfer salts tetrathiofulvalene (TF) and tetracyanoquinodimethane (TCNQ). A small percentage (<10 wt.%) of these dopants added to otherwise insulating material produces semiconducting bulk resistivities on the order of 10/sup 6/ to 10/sup 10 / Omega -cm. Such semiconducting material could form the basis for easily produced, rugged, high-voltage load resistors, high-voltage grading films and coatings for use with high voltage platforms, terminals, acceleration columns, and power supply testing. Specific goals were consistent reproducibility, easily controlled process parameters for resistance adjustment, wide resistance range, and a low-to-modest processing hardware investment. Conductive materials with a wide range of resistivity (10/sup 3/-10/sup 10 / Omega -cm) have been easily fabricated.<>
Keywords :
conducting polymers; filled polymers; high-voltage techniques; nuclear electronics; organic semiconductors; particle accelerators; power supplies to apparatus; 10/sup 3/ to 10/sup 10/ ohmcm; TCNQ; TF; acceleration columns; antistatic additives; coatings; grading films; high voltage applications; high voltage platforms; high-voltage power supplies; insulating material; load resistors; organic charge-transfer salts; particle accelerators; processing hardware investment; reproducibility; resistance adjustment; resistance range; reticulant doped semiconductor epoxies plastics; semiconducting material; terminals; tetracyanoquinodimethane; tetrathiofulvalene; Additives; Conductivity; Insulation; Linear particle accelerator; Plastics; Power supplies; Resistors; Semiconductivity; Semiconductor device doping; Semiconductor materials;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
Conference_Location :
Santa Fe, NM, USA
Print_ISBN :
0-7803-0513-2
DOI :
10.1109/NSSMIC.1991.259072