DocumentCode :
3459550
Title :
Accuracy study on the newly introduced Anritsu W1-connector calibration and verification kit
Author :
Lee, Yeou-Song ; Roberts, Tom
Author_Institution :
Anritsu Co., Morgan Hill, CA, USA
fYear :
2003
fDate :
4-5 Dec. 2003
Firstpage :
109
Lastpage :
118
Abstract :
The coaxial applications of the vector network analyzer have become very popular in recent years. Anritsu Company launched its flagship, Panorama vector network analyzer covering measurements from 45 MHz to 110 GHz two years ago. The calibration solution of the Anritsu vector network analyzer was built with high flexibility and options of the wave-guide, on-wafer, and coaxial standards. Most of the coaxial calibration standards for this high frequency system use the line-reflection-line (LRL) structure. They are neither economically feasible nor viable for manufacturing and not available for most of the users. In this report, we introduce the new calibration and verification kit and discuss an improved connector design. The calibration scheme for this kit utilizes combinations of the short-open-load-thru and two additional shorts for the frequency coverage from 45 MHz to 110 GHz. The accuracy of the calibration kit was investigated and is included in this report. In addition, the verification standards are provided as part of the calibration kit. We have conducted a very rigorous accuracy study on these devices and a brief report of our results were presented. Most manufacturers of coaxial calibration kits derive a single set of coefficients during the product development phase which are then used for every cal kit manufactured and sold. One set of coefficients is assigned to all cal kits produced in manufacturing. Since there are variations in the manufacturing process, the coefficients may not provide optimal Source Match and Directivity performance for each kit manufactured. An alternative to the "one set" approach is to optimize inductance and capacitance coefficients for each cal kit manufactured to provide the best performance for the customer. This approach can provide better Source Match and Directivity performance relative to the "one set" approach.
Keywords :
calibration; coaxial waveguides; electric connectors; measurement standards; network analysers; 0.045 to 110 GHz; Anritsu W1-connector; Anritsu vector network analyzer; Panorama vector network analyzer; capacitance coefficients; coaxial applications; coaxial calibration kits; coaxial calibration standards; coaxial standards; connector calibration kit; connector verification kit; directivity performance; inductance coefficients; line-reflection-line structure; manufacturing process; on-wafer standards; one set approach; short-open-load-thru; source match performance; verification standards; wave-guide standards; Calibration; Coaxial components; Conducting materials; Connectors; Frequency; Fuel economy; Impedance; Manufacturing processes; Optical waveguides; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurements Conference, 2003. Fall 2003. 62nd ARFTG
Print_ISBN :
0-7803-8195-5
Type :
conf
DOI :
10.1109/ARFTGF.2003.1459762
Filename :
1459762
Link To Document :
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