Title :
Optimal Importance Sampling for Quick Simulation of Highly Reliable Markovian Systems
Author :
Strickland, Stephen G.
Author_Institution :
Dept. of Systems Engineering, University of Virginia
Keywords :
Analytical models; Computational modeling; Discrete event simulation; Failure analysis; Monte Carlo methods; Reliability engineering; Sampling methods; Sufficient conditions; Systems engineering and theory; Yield estimation;
Conference_Titel :
Simulation Conference Proceedings, 1993. Winter
Print_ISBN :
0-7803-1381-X
DOI :
10.1109/WSC.1993.718083