• DocumentCode
    3459814
  • Title

    Continuous procrustes analysis to learn 2D shape models from 3D objects

  • Author

    Igual, Laura ; De La Torre, Fernando

  • Author_Institution
    Univ. de Barcelona, Barcelona, Spain
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    17
  • Lastpage
    22
  • Abstract
    Two dimensional shape models have been successfully applied to solve many problems in computer vision such as object tracking, recognition and segmentation. Typically, 2D shape models (e.g. Point Distribution Models, Active Shape Models) are learned from a discrete set of image landmarks once the rigid transformations are removed applying Procrustes Analysis (PA). However, the standard PA process suffers from two main limitations: (i) the 2D training samples do not necessarily cover a uniform sampling of all 3D transformations of an object. This can bias the estimate of the shape model; (ii) it can be computationally expensive to learn the shape model by sampling 3D transformations; To solve these problems, we propose Continuous Procrustes Analysis (CPA). CPA uses a continuous formulation that avoids the need to generate 2D projections from all 3D rigid transformations. Furthermore, it builds an efficient (space and time) non-biased 2D shape model from a 3D model of an object. Preliminary experimental results to build 2D shape models of objects and faces show the benefits of CPA over PA.
  • Keywords
    computational geometry; computer vision; image recognition; image segmentation; object detection; 2D shape models; 3D objects; 3D transformations; active shape models; computer vision; continuous procrustes analysis; image landmarks; object tracking; point distribution models; recognition; segmentation; Active shape model; Computer vision; Face detection; Image analysis; Image sampling; Image segmentation; Labeling; Object recognition; Principal component analysis; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-7029-7
  • Type

    conf

  • DOI
    10.1109/CVPRW.2010.5543280
  • Filename
    5543280