DocumentCode :
3459946
Title :
Effect of surface structure on the contact resistance measurements of electrodeposits
Author :
Holden, C.A. ; Law, H.H. ; Crane, G.R.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fYear :
1988
fDate :
26-29 Sept. 1988
Firstpage :
93
Lastpage :
99
Abstract :
It has been demonstrated with gray nickel phosphorus alloy (Ni/P) deposits and with gray nickel (NiCl) deposits that achieving consistently low R/sub c/ using base metal deposits requires a surface morphology with a multitudinous number of tightly space asperities of uniform height. These asperities, on a microscopic (5000*) scale, can appear to be acicular star-burst or gritty (sand-like) and will maintain low R/sub c/ as long as they meet the criteria of tight spacing and uniform size. Representative samples of these base metal gray deposits have maintained R/sub c/<10 m Omega after exposure to 50 degrees C and 95% relative humidity for nine months. In comparison, R/sub c/ values of standard nickel deposits from a Watts nickel bath were approximately 400 m Omega after only four days of exposure. To demonstrate that it is the surface microstructure of the deposit that yields the desirable R/sub c/ behavior, gray palladium deposits with an acicular surface structure similar to that of gray Ni/P deposits were investigated. In a relatively severe humid environment containing HCl, gray palladium deposits had lower R/sub c/ than wrought palladium.<>
Keywords :
contact resistance; electrical contacts; electrodeposition; environmental testing; nickel; scanning electron microscope examination of materials; surface structure; 0.75 y; 10 mohm; 50 C; 95% relative humidity; Ni gray deposits; Pd gray deposits; Watts nickel bath; acicular surface structure; base metal gray deposits; contact resistance measurements; electrodeposits; multitudinous number of tightly space asperities; severe humid environment; surface microstructure; surface morphology; surface structure effects; uniform height asperities; Contact resistance; Electrical resistance measurement; Humidity; Microscopy; Microstructure; Nickel alloys; Palladium; Surface morphology; Surface resistance; Surface structures;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on
Conference_Location :
San Francisco, CA, USA
Type :
conf
DOI :
10.1109/HOLM.1988.16102
Filename :
16102
Link To Document :
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