Title :
A single-chip oscillator based on a deep-submicron gap CMOS-MEMS resonator array with a high-stiffness driving scheme
Author :
Huan-Chun Su ; Ming-Huang Li ; Chao-Yu Chen ; Sheng-Shian Li
Author_Institution :
Inst. of NanoEngineering & Microsyst., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
This work reports the design of a monolithic oscillator based on a low motional impedance (Rm) CMOS-MEMS resonator array with a high-stiffness driving scheme in a standard 0.35 μm CMOS. Combined with the previously developed polysilicon release process and the proposed “contact-array-assisted” transducer design, a tiny equivalent transducer´s gap (deff) of only 190 nm is successfully attained. Based on this feature, a low Rm of 10 kΩ is achieved under a medium bias voltage (VP) of 36 V for a 4.22-MHz resonator, which demonstrates the lowest Rm among its CMOS-MEMS counterparts to date. The combination of the mechanically coupled array and high-stiffness driving scheme significantly enhances oscillator performance in terms of far-from-carrier phase noise. The 4.22-MHz single-chip CMOS-MEMS oscillator exhibits the phase noise of -90 dBc/Hz at 1-kHz offset and -121 dBc/Hz at 1-MHz offset, respectively.
Keywords :
CMOS analogue integrated circuits; elemental semiconductors; integrated circuit design; integrated circuit noise; microcavities; micromechanical resonators; monolithic integrated circuits; oscillators; phase noise; silicon; transducers; bias voltage; contact-array-assisted transducer design; deep-submicron gap CMOS-MEMS resonator array; equivalent transducer gap; far-from-carrier phase noise; frequency 4.22 MHz; high-stiffness driving scheme; monolithic oscillator; motional impedance; polysilicon; resistance 10 kohm; single-chip CMOS-MEMS oscillator; single-chip oscillator; size 0.35 mum; size 190 nm; voltage 36 V; Arrays; Frequency measurement; Impedance; Micromechanical devices; Optical resonators; Phase noise; CMOS-MEMS; high-stiffness driving; monolithic integration; motional impedance; oscillator; phase noise;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), 2015 Transducers - 2015 18th International Conference on
Conference_Location :
Anchorage, AK
DOI :
10.1109/TRANSDUCERS.2015.7180879