• DocumentCode
    3461061
  • Title

    An improved method of parameter abstraction for a novel diode reverse recovery model in time-domain simulation

  • Author

    Wang, Hao ; Liu, Jinjun ; Wang, Runxin ; Fang, Qian

  • Author_Institution
    Sch. of Electr. Eng., Xi´´an Jiaotong Univ., Xi´´an
  • fYear
    2008
  • fDate
    24-28 Feb. 2008
  • Firstpage
    1664
  • Lastpage
    1668
  • Abstract
    Based on the Lauritzen and Ma model, diode model with reverse recovery characteristic can be built following a modeling procedure presented in the authors´ previous paper. But using the original modeling procedure, the diode model will cause large error on peak reverse current in some cases. Defect analysis and improvement of the modeling procedure are present in this paper. By revealing that the averaging of tau and TM in different conditions causes the diode model with large error on peak reverse current evaluation, new tau and TM derivation method is proposed to improve the modeling procedure. Following the proposed modeling procedure, the diode model can be built and fits in with different implementation in dc-dc converters and PFC circuit. Simulation and hardware tests are done to verify that the diode models with the proposed modeling procedure are greatly improved in the peak reverse current in different implementation cases.
  • Keywords
    DC-DC power convertors; diodes; power factor correction; time-domain analysis; PFC circuit; dc-dc converters; diode reverse recovery model; parameter abstraction; peak reverse current; time-domain simulation; Circuit simulation; Circuit testing; DC-DC power converters; Diodes; Electronic mail; Equations; Hardware; Resistors; Time domain analysis; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-1873-2
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2008.4522949
  • Filename
    4522949