DocumentCode
3461133
Title
A novel electrothermal IGBT modeling approach for circuit simulation design
Author
Rosu, Marius ; Wu, Xiaojie ; Cendes, Z. ; Aurich, Joachim ; Hornkamp, M.
Author_Institution
Ansoft Co., Pittsburgh, PA
fYear
2008
fDate
24-28 Feb. 2008
Firstpage
1685
Lastpage
1689
Abstract
This paper describes a novel electrothermal coupling simulation model for analyzing IGBT power devices for large scale applications. The model calculates the conduction and switching losses in a wide range of operation points and returns an accurate temperature prediction. The electrical and thermal model parameters are extracted from the manufacturer catalog datasheet values. The new model device on-voltage characteristics show good agreement with measured results. The thermal model can take into account lateral heat spreading within the module and thermal interference among power devices. The features of the present model are described and compared against the simulation results of a half-bridge circuit and three phase inverter topology.
Keywords
insulated gate bipolar transistors; power bipolar transistors; semiconductor device models; IGBT power devices; circuit simulation design; conduction losses; device on-voltage characteristics; electrothermal IGBT modeling; half-bridge circuit; large scale applications; switching losses; temperature prediction; thermal interference; three phase inverter topology; Analytical models; Circuit simulation; Coupling circuits; Electrothermal effects; Insulated gate bipolar transistors; Large-scale systems; Predictive models; Switching loss; Temperature distribution; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
Conference_Location
Austin, TX
ISSN
1048-2334
Print_ISBN
978-1-4244-1873-2
Electronic_ISBN
1048-2334
Type
conf
DOI
10.1109/APEC.2008.4522953
Filename
4522953
Link To Document