DocumentCode :
3461133
Title :
A novel electrothermal IGBT modeling approach for circuit simulation design
Author :
Rosu, Marius ; Wu, Xiaojie ; Cendes, Z. ; Aurich, Joachim ; Hornkamp, M.
Author_Institution :
Ansoft Co., Pittsburgh, PA
fYear :
2008
fDate :
24-28 Feb. 2008
Firstpage :
1685
Lastpage :
1689
Abstract :
This paper describes a novel electrothermal coupling simulation model for analyzing IGBT power devices for large scale applications. The model calculates the conduction and switching losses in a wide range of operation points and returns an accurate temperature prediction. The electrical and thermal model parameters are extracted from the manufacturer catalog datasheet values. The new model device on-voltage characteristics show good agreement with measured results. The thermal model can take into account lateral heat spreading within the module and thermal interference among power devices. The features of the present model are described and compared against the simulation results of a half-bridge circuit and three phase inverter topology.
Keywords :
insulated gate bipolar transistors; power bipolar transistors; semiconductor device models; IGBT power devices; circuit simulation design; conduction losses; device on-voltage characteristics; electrothermal IGBT modeling; half-bridge circuit; large scale applications; switching losses; temperature prediction; thermal interference; three phase inverter topology; Analytical models; Circuit simulation; Coupling circuits; Electrothermal effects; Insulated gate bipolar transistors; Large-scale systems; Predictive models; Switching loss; Temperature distribution; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
Conference_Location :
Austin, TX
ISSN :
1048-2334
Print_ISBN :
978-1-4244-1873-2
Electronic_ISBN :
1048-2334
Type :
conf
DOI :
10.1109/APEC.2008.4522953
Filename :
4522953
Link To Document :
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