• DocumentCode
    3461133
  • Title

    A novel electrothermal IGBT modeling approach for circuit simulation design

  • Author

    Rosu, Marius ; Wu, Xiaojie ; Cendes, Z. ; Aurich, Joachim ; Hornkamp, M.

  • Author_Institution
    Ansoft Co., Pittsburgh, PA
  • fYear
    2008
  • fDate
    24-28 Feb. 2008
  • Firstpage
    1685
  • Lastpage
    1689
  • Abstract
    This paper describes a novel electrothermal coupling simulation model for analyzing IGBT power devices for large scale applications. The model calculates the conduction and switching losses in a wide range of operation points and returns an accurate temperature prediction. The electrical and thermal model parameters are extracted from the manufacturer catalog datasheet values. The new model device on-voltage characteristics show good agreement with measured results. The thermal model can take into account lateral heat spreading within the module and thermal interference among power devices. The features of the present model are described and compared against the simulation results of a half-bridge circuit and three phase inverter topology.
  • Keywords
    insulated gate bipolar transistors; power bipolar transistors; semiconductor device models; IGBT power devices; circuit simulation design; conduction losses; device on-voltage characteristics; electrothermal IGBT modeling; half-bridge circuit; large scale applications; switching losses; temperature prediction; thermal interference; three phase inverter topology; Analytical models; Circuit simulation; Coupling circuits; Electrothermal effects; Insulated gate bipolar transistors; Large-scale systems; Predictive models; Switching loss; Temperature distribution; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-1873-2
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2008.4522953
  • Filename
    4522953