Inference on the MTTF of LEDs from Accelerated Degradation Data with Bootstrap Method

In reliability analysis, engineers lacks confidence to verify the mean time to failure of high power light emitting diodes from aging or degradation tests. The lifetime information, however, is important to manufacturers to improve the quality of light emitting diodes. The paper provides a bootstrap computation procedure to infer the mean time to failure of high power light emitting diodes. Assume that the degradation paths collected from an accelerated degradation test follow a Wiener process, confidence interval of the mean time to failure of high power light emitting diodes is found based on bootstrap percentiles. An illustrating example of GaN-based LEDs is used to demonstrate the use of the proposed method.