Title :
The effect of delay error on the sidelobe level in synthetic aperture imaging
Author :
Watanabe, Kazuhiro ; Noda, Takuya ; Shiba, Akira ; Iida, Atsuo ; Murakami, Kazuki ; Shimura, Takaki
Author_Institution :
Fujitsu Labs. Ltd., Akashi, Japan
Abstract :
The synthetic aperture method, which synthesizes a large aperture by multiplexing a small transmit/receive aperture, is known to have two major advantages: (1) mainlobe narrower than one-way dynamic focusing in reception, and (2) a hardware volume smaller than in the synthetic focusing method, which requires that every element receives a reflected signal for each transmitting element. This paper describes the influence of delay error on the sidelobe in the synthetic aperture method. The simulation results show that in order to suppress the sidelobe level below -40 dB at 3.5 MHz, the combined delay fluctuations among the small apertures caused by the wavefront distortion in the medium and by the electronics should be less than 3 ns. As the propagation time inhomogeneity in a typical medium such as a phantom test object or a human body causes fluctuations of more than 15 ns of arrival time among the small apertures, the results lead to the conclusion that the synthetic aperture method is not effective on such a medium
Keywords :
biomedical ultrasonics; image resolution; ultrasonic focusing; ultrasonic transducer arrays; 3.5 MHz; arrival time; delay error; delay fluctuations; hardware volume; human body; large aperture; mainlobe; multiplexing; one-way dynamic focusing; phantom test object; phased array ultrasonic imaging systems; propagation time inhomogeneity; reception; reflected signal; sidelobe level; simulation results; small apertures; small transmit/receive aperture; synthetic aperture imaging; synthetic focusing method; transmitting element; wavefront distortion; Apertures; Delay effects; Fluctuations; Focusing; Hardware; Image reconstruction; Image storage; Phased arrays; Signal processing; Signal synthesis;
Conference_Titel :
Ultrasonics Symposium, 1996. Proceedings., 1996 IEEE
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-3615-1
DOI :
10.1109/ULTSYM.1996.584382