• DocumentCode
    3461829
  • Title

    Low complexity MPPT technique exploiting the effect of the PV cell series resistance

  • Author

    Scarpa, V.V. ; Spiazzi, G. ; Buso, S.

  • Author_Institution
    Dept. of Inf. Eng., Univ. of Padova, Padova
  • fYear
    2008
  • fDate
    24-28 Feb. 2008
  • Firstpage
    1958
  • Lastpage
    1964
  • Abstract
    This paper proposes a method for estimating the maximum power point (MPP) of a photovoltaic (PV) module through a simple linear equation, exploiting the relation existing between the values of module voltage and current at the maximum power point (MPP locus). The analytical study of the electrical model shows that this relation tends to be linear for the higher irradiation conditions due to the effect of the PV cell series resistance. Based on that, a linear approximation of the MPP locus is derived, whose parameters are simply related to those of the electrical parameters of a PV cell. The proposed solution presents the same complexity but higher effectiveness when compared to other estimation MPPT methods. Furthermore, the estimation is inherently compensated for temperature variations by periodically sensing the module open circuit voltage (Voc). The proposed method is suitable for low cost PV systems and was successfully tested in a solar powered 55 W battery charger circuit.
  • Keywords
    battery chargers; photovoltaic power systems; PV cell series resistance; irradiation conditions; linear approximation; low complexity MPPT technique; maximum power point; photovoltaic module; solar powered battery charger circuit; Circuit testing; Costs; Electric resistance; Equations; Linear approximation; Photovoltaic systems; Solar power generation; System testing; Temperature sensors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2008. APEC 2008. Twenty-Third Annual IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-1873-2
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2008.4522996
  • Filename
    4522996