Title :
Development of nanometer scale temperature measurement method with polarized near-field light
Author :
Hosaka, Sumio ; Nitta, Jumpei ; Taguchi, Yasuhiro ; Nagasaka, Y. ; Saiki, T.
Author_Institution :
Sch. of Integrated Design Eng., Keio Univ., Yokohama, Japan
Abstract :
We report on the development of a temperature measurement method at the nanoscale using polarized near-field light. In this method, temperature measurement is accomplished by detecting the near-field polarization change in illumination-collection mode operation.
Keywords :
light polarisation; nanophotonics; temperature measurement; illumination-collection mode operation; nanometer scale temperature measurement; polarized near-field light; Laser beams; Measurement by laser beam; Polarization; Refractive index; Sensitivity; Spatial resolution; Temperature measurement; Near-field optics; Polarization; Thermometry;
Conference_Titel :
Optical MEMS and Nanophotonics (OMN), 2011 International Conference on
Conference_Location :
Istanbul
Print_ISBN :
978-1-4577-0334-8
DOI :
10.1109/OMEMS.2011.6031103
