Title :
A CMOS Image Sensor Integrating Column-Parallel Cyclic ADCs with On-Chip Digital Error Correction Circuits
Author :
Kawahito, Shoji ; Park, Jong-Ho ; Isobe, Keigo ; Shafie, Suhaidi ; Iida, Tetsuya ; Mizota, Takashi
Author_Institution :
Shizuoka Univ., Hamamatsu
Abstract :
This paper presents a CMOS image sensor integrating a 14b column-parallel cyclic ADC with on-chip digital error correction circuits. Column-parallel ADC arrays are located both above and below the pixel array. The area of the on-chip error-correction logic including memories for all the error coefficients of the 640 ADC channels is 0.85mmx7.9mm.
Keywords :
CMOS image sensors; analogue-digital conversion; error correction; ADC channels; CMOS image sensor; column-parallel cyclic ADC; error coefficients; error-correction logic; on-chip digital error correction circuits; pixel array; CMOS image sensors; CMOS technology; Capacitors; Circuits; Dynamic range; Error correction; Image sensors; Noise cancellation; Pixel; Prototypes;
Conference_Titel :
Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2010-0
Electronic_ISBN :
978-1-4244-2011-7
DOI :
10.1109/ISSCC.2008.4523054
