• DocumentCode
    3462450
  • Title

    An EM algorithm for brain tumor image registration: A tumor growth modeling based approach

  • Author

    Gooya, Ali ; Biros, George ; Davatzikos

  • Author_Institution
    Sect. of Biomed. Image Anal., Univ. of Pennsylvania, Philadelphia, PA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    39
  • Lastpage
    46
  • Abstract
    This paper investigates the problem of atlas registration of brain images with tumors. Multi-parametric imaging modalities are first utilized for segmentations of different tissues, and to compute the posterior probability map (PBM) of membership to each tissue class, using supervised learning. Similar maps are generated in the initially normal atlas, by modeling the tumor growth. An Expectation-Maximization algorithm is used to estimate the spatial transformation and other parameters related to tumor simulation are optimized through Asynchronous Parallel Pattern Search (APPSPACK). The proposed method has been evaluated on simulated data sets created by Statistically Simulated Deformations (SSD), and real multichannel Glioma data sets. The performance has been evaluated both quantitatively and qualitatively. The results show that our method is promising to achieve a good similarity between the warped templates and patient images.
  • Keywords
    expectation-maximisation algorithm; image registration; learning (artificial intelligence); medical image processing; tumours; EM algorithm; asynchronous parallel pattern search; brain tumor image registration; expectation-maximisation algorithm; multiparametric imaging modalities; posterior probability map; statistically simulated deformations; supervised learning; tumor growth modeling; Algorithm design and analysis; Biomedical imaging; Brain modeling; Deformable models; Expectation-maximization algorithms; Image analysis; Image registration; Image segmentation; Neoplasms; Pathology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-7029-7
  • Type

    conf

  • DOI
    10.1109/CVPRW.2010.5543440
  • Filename
    5543440