DocumentCode :
3462460
Title :
An MRF-based statistical deformation model for morphological image analysis
Author :
Caban, Jesus J. ; Rheingans, Penny ; Yoo, Terry
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
31
Lastpage :
38
Abstract :
As collections of 2D/3D images continue to grow, interest in effective ways to use the statistical morphological properties of a group of images to enhance biomedical image analysis has surged. During the last several years, advances in non-linear registration techniques have made possible the fast estimation of highly accurate deformation fields with dense feature correspondences between two images. Recently, statistical deformation models (SDMs) have emerged as effective methods to capture the statistical and structural properties of a collection of images directly from a set of deformation fields. We present a method to create a robust SDM model that can be used in multiple biomedical applications including image classification, diagnosis, generation, and completion. In particular, we introduce a Markov-based SDM model which uses the deformation properties and contextual relationships to more effectively learn the statistical morphological properties of a group of images. To show the strengths and limitations of our approach, the framework has been tested with synthetic and real-world medical volumes.
Keywords :
Markov processes; image classification; image registration; medical image processing; statistical analysis; MRF; Markov based SDM model; biomedical image analysis; diagnosis; image classification; morphological image analysis; nonlinear registration techniques; statistical deformation models; Biomedical imaging; Context modeling; Deformable models; Image analysis; Image classification; Image generation; Medical diagnostic imaging; Medical tests; Robustness; Surges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
Conference_Location :
San Francisco, CA
ISSN :
2160-7508
Print_ISBN :
978-1-4244-7029-7
Type :
conf
DOI :
10.1109/CVPRW.2010.5543441
Filename :
5543441
Link To Document :
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