• DocumentCode
    3462460
  • Title

    An MRF-based statistical deformation model for morphological image analysis

  • Author

    Caban, Jesus J. ; Rheingans, Penny ; Yoo, Terry

  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    31
  • Lastpage
    38
  • Abstract
    As collections of 2D/3D images continue to grow, interest in effective ways to use the statistical morphological properties of a group of images to enhance biomedical image analysis has surged. During the last several years, advances in non-linear registration techniques have made possible the fast estimation of highly accurate deformation fields with dense feature correspondences between two images. Recently, statistical deformation models (SDMs) have emerged as effective methods to capture the statistical and structural properties of a collection of images directly from a set of deformation fields. We present a method to create a robust SDM model that can be used in multiple biomedical applications including image classification, diagnosis, generation, and completion. In particular, we introduce a Markov-based SDM model which uses the deformation properties and contextual relationships to more effectively learn the statistical morphological properties of a group of images. To show the strengths and limitations of our approach, the framework has been tested with synthetic and real-world medical volumes.
  • Keywords
    Markov processes; image classification; image registration; medical image processing; statistical analysis; MRF; Markov based SDM model; biomedical image analysis; diagnosis; image classification; morphological image analysis; nonlinear registration techniques; statistical deformation models; Biomedical imaging; Context modeling; Deformable models; Image analysis; Image classification; Image generation; Medical diagnostic imaging; Medical tests; Robustness; Surges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-7029-7
  • Type

    conf

  • DOI
    10.1109/CVPRW.2010.5543441
  • Filename
    5543441