Title :
Integrated organic optoelectronic system for refractometric measurements
Author :
Threm, D. ; Nazirizadeh, Yousef ; Pradana, A. ; Radler, M. ; Mikat, J. ; Gerken, M.
Author_Institution :
Inst. of Electr. & Inf. Eng., Christian-Albrechts-Univ. zu Kiel, Kiel, Germany
Abstract :
We present a compact optical measurement system with wet-processed organic light-emitting diodes (OLEDs) and organic photodiodes (OPDs) placed on a single substrate. Refractometric measurements based on changed waveguiding properties are demonstrated.
Keywords :
integrated optics; integrated optoelectronics; organic light emitting diodes; photodiodes; refractive index measurement; OLED; OPD; integrated organic optoelectronic system; optical measurement system; organic light-emitting diodes; organic photodiodes; refractometric measurements; waveguiding properties; Current measurement; Glass; Organic light emitting diodes; Reflection; Refractive index; Substrates; OLED; OPD; refractive index; single substrate; spin-coating; total internal reflection;
Conference_Titel :
Optical MEMS and Nanophotonics (OMN), 2011 International Conference on
Conference_Location :
Istanbul
Print_ISBN :
978-1-4577-0334-8
DOI :
10.1109/OMEMS.2011.6031112
