DocumentCode
3462628
Title
Two-point correlation as a feature for histology images: Feature space structure and correlation updating
Author
Cooper, Lee ; Saltz, Joel ; Machiraju, Raghu ; Huang, Kun
Author_Institution
Center for Comprehensive Inf., Emory Univ., Atlanta, GA, USA
fYear
2010
fDate
13-18 June 2010
Firstpage
79
Lastpage
86
Abstract
The segmentation of tissues in whole-slide histology images is a necessary step for the morphological analyses of tissues and cellular structures. Previous works have demonstrated the potential of two-point correlation functions (TPCF) as features for tissue segmentation, however the feature space is not yet well understood and computational methods are lacking. This paper illustrates several fundamental aspects of TPCF feature space and contributes a fast algorithm for deterministic feature computation. Despite the high-dimensionality of TPCF feature space, the features corresponding to different tissues are shown to be characterized by low-dimensional manifolds. The relationship between TPCF and the familiar co-occurrence matrix is highlighted, and it is shown that costly cross correlations are not necessary to achieve an accurate segmentation. For computation, the method of correlation updating, based on the linearity of the correlation operator, is proposed and shown to achieve up to a 67X speedup over frequency domain computation methods. Segmentation results are demonstrated on multiple tissues and natural texture images.
Keywords
biological tissues; biology computing; correlation methods; feature extraction; image segmentation; image texture; TPCF feature space; co-occurrence matrix; feature space structure; histology images; morphological analyses; tissue segmentation; two-point correlation; Biomedical informatics; Biomedical measurements; Extracellular; Frequency domain analysis; Gabor filters; Image analysis; Image segmentation; Linearity; Nuclear measurements; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
Conference_Location
San Francisco, CA
ISSN
2160-7508
Print_ISBN
978-1-4244-7029-7
Type
conf
DOI
10.1109/CVPRW.2010.5543453
Filename
5543453
Link To Document