• DocumentCode
    3462628
  • Title

    Two-point correlation as a feature for histology images: Feature space structure and correlation updating

  • Author

    Cooper, Lee ; Saltz, Joel ; Machiraju, Raghu ; Huang, Kun

  • Author_Institution
    Center for Comprehensive Inf., Emory Univ., Atlanta, GA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    79
  • Lastpage
    86
  • Abstract
    The segmentation of tissues in whole-slide histology images is a necessary step for the morphological analyses of tissues and cellular structures. Previous works have demonstrated the potential of two-point correlation functions (TPCF) as features for tissue segmentation, however the feature space is not yet well understood and computational methods are lacking. This paper illustrates several fundamental aspects of TPCF feature space and contributes a fast algorithm for deterministic feature computation. Despite the high-dimensionality of TPCF feature space, the features corresponding to different tissues are shown to be characterized by low-dimensional manifolds. The relationship between TPCF and the familiar co-occurrence matrix is highlighted, and it is shown that costly cross correlations are not necessary to achieve an accurate segmentation. For computation, the method of correlation updating, based on the linearity of the correlation operator, is proposed and shown to achieve up to a 67X speedup over frequency domain computation methods. Segmentation results are demonstrated on multiple tissues and natural texture images.
  • Keywords
    biological tissues; biology computing; correlation methods; feature extraction; image segmentation; image texture; TPCF feature space; co-occurrence matrix; feature space structure; histology images; morphological analyses; tissue segmentation; two-point correlation; Biomedical informatics; Biomedical measurements; Extracellular; Frequency domain analysis; Gabor filters; Image analysis; Image segmentation; Linearity; Nuclear measurements; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-7029-7
  • Type

    conf

  • DOI
    10.1109/CVPRW.2010.5543453
  • Filename
    5543453