Title :
On The Leakage Current Mechanism In Non-uniform Film Polycrystalline Silicon TFTs
Author :
Kumar, Ajit ; Sin, Johnny K. O. ; Hoi S.Kwok
Keywords :
Active matrix liquid crystal displays; Electric resistance; Flat panel displays; Grain boundaries; Leakage current; Semiconductor films; Silicon compounds; Temperature; Testing; Thin film transistors;
Conference_Titel :
Information Display, 1997., Proceedings of the Fourth Asian Symposium on
Conference_Location :
Hong Kong, China
Print_ISBN :
962-8273-01-9
DOI :
10.1109/ASID.1997.631436
