Title :
A T-Coil-Enhanced 8.5Gb/s High-Swing source-Series-Terminated Transmitter in 65nm Bulk CMOS
Author :
Kossel, Marcel ; Menolfi, Christian ; Weiss, Jonas ; Buchmann, Peter ; Von Bueren, George ; Rodoni, Lucio ; Morf, Thomas ; Toifl, Thomas ; Schmatz, Martin
Author_Institution :
IBM Zurich Res. Lab., Zurich
Abstract :
Source-series-terminated (SST) drivers offer the advantage of providing a large range of termination voltages, making them particularly suitable for multi-standard I/Os. Many standards however, call for larger vertical eye openings that require raising the dc supply voltage from the 1.0 V limit for thin-oxide devices(FETs) in 65 nm technology to 1.2 or 1.5 V. These requirements are addressed in the proposed SST transmitter design by combining a thin-oxide pre-driver stage running at 1.0 V followed by thick-oxide output stages operated at 1.5 V. Key features of this design include the implementation of tri-statable output slices consisting of programmable binary-weighted pre-distortion slices to achieve a mutually independent adjustment of the impedance tuning and FIR-based transmitter equalization, the level shifter design and the application of T-coils that enable a broad-band impedance matching with a return loss of -16 dB over 10 GHz bandwidth. Moreover, the transmitter is capable to suppress the clock duty-cycle distortion by a factor of 5x.
Keywords :
CMOS integrated circuits; FIR filters; clocks; coils; driver circuits; equalisers; field effect transistors; impedance matching; transmitters; CMOS; FET; FIR-based transmitter equalization; SST transmitter design; bit rate 8.5 Gbit/s; clock duty-cycle distortion suppression; high-swing source-series-termination; impedance tuning; programmable binary-weighted predistortion; return loss; size 65 nm; source-series-terminated driver; thin-oxide device; Circuits; Clocks; Electrostatic discharge; FETs; Impedance; Loss measurement; MOSFETs; Multiplexing; Optical transmitters; Resistors;
Conference_Titel :
Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2010-0
Electronic_ISBN :
978-1-4244-2011-7
DOI :
10.1109/ISSCC.2008.4523081