• DocumentCode
    3462973
  • Title

    A mutual-information scale-space for image feature detection and feature-based classification of volumetric brain images

  • Author

    Toews, Matthew ; Wells, William M., III

  • Author_Institution
    Harvard Med. Sch., Brigham & Women´´s Hosp., Boston, MA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    111
  • Lastpage
    116
  • Abstract
    This paper proposes a novel information theoretic scale-space for salient feature detection, based on the mutual information (MI) of image measurement and location. The MI scale-space is designed to identify image regions whose measurements are maximally informative regarding spatial location. A framework for computing the MI scale-space is proposed, based on combining information theory with Gaussian scale-space theory, where uncertainty in spatial location is explicitly defined by the heat equation. Experiments investigate the use of MI features for feature-based classification of Alzheimer´s subjects in volumetric magnetic resonance imagery from a public data set, where MI features result in higher classification accuracy than features selected according to the established difference-of-Gaussian (DOG) criterion.
  • Keywords
    Gaussian processes; biology computing; feature extraction; image classification; medical image processing; Alzheimer subject; Gaussian scale-space theory; difference-of-Gaussian criterion; feature-based classification; heat equation; image feature detection; image measurement; image region identification; information theory; mutual information scale-space; mutual-information scale-space; public data set; salient feature detection; volumetric brain image; volumetric magnetic resonance imagery; Biology computing; Biomedical imaging; Brain; Computer vision; Entropy; Hospitals; Image matching; Information theory; Magnetic resonance; Mutual information;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-7029-7
  • Type

    conf

  • DOI
    10.1109/CVPRW.2010.5543471
  • Filename
    5543471