DocumentCode :
3463067
Title :
Linearity and dynamic loadlines of CE and CB SiGe HBTs under the influence of DC bias
Author :
Qin, Guoxuan ; Wang, Guogong ; Li, Hui ; Ma, Zhenqiang
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin-Madison Univ., Madison, WI
fYear :
2006
fDate :
Oct. 2006
Firstpage :
185
Lastpage :
187
Abstract :
Linearity characteristics and dynamic loadlines of common-emitter (CE) and common-base (CB) configuration SiGe HBTs are analyzed and compared at 6GHz under different bias conditions. It is shown that the CB configuration can have both higher power gain and better linearity than the CE configuration under certain bias conditions. Dynamic loadlines of CE and CB configurations are compared and correlated with the linearity of SiGe HBTs under different DC bias conditions. Unlike the CE configuration, of which the linearity characteristic is almost independent of DC bias, it is shown from dynamic loadlines that the linearity of CB SiGe HBTs can be significantly improved by varying the bias conditions
Keywords :
Ge-Si alloys; heterojunction bipolar transistors; microwave bipolar transistors; 6 GHz; DC bias; Linearity characteristics; SiGe; SiGe HBT; common-base configuration; common-emitter configuration; dynamic loadlines; Distortion measurement; Drives; Fingers; Germanium silicon alloys; Heterojunction bipolar transistors; Linearity; Power engineering and energy; Radio frequency; Silicon germanium; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
Type :
conf
DOI :
10.1109/ICSICT.2006.306133
Filename :
4098055
Link To Document :
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