Degradation Mechanism Of Electron Emission Characteristics In Silicon Field Emitters

Author

Yoon-Ho Song ; Yong-Min Kim ; Byung Sung O ; Jin Ho Lee ; Kyoung Ik Cho ; Hyung Joun Yoo

fYear

1997

fDate

13-14 Feb. 1997

Firstpage

211

Lastpage

214

Keywords

Chemical processes; Current measurement; Electron emission; Etching; Fabrication; Field emitter arrays; Thermal degradation; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Information Display, 1997., Proceedings of the Fourth Asian Symposium on

Conference_Location

Hong Kong, China

Print_ISBN

962-8273-01-9

Type

DOI

10.1109/ASID.1997.631439

Filename

631439

Link To Document