Title :
Voltage disturbance generator with phase jump for the test of microgrid
Author :
Nho, Eui-Cheol ; Jung, Jae-Hun ; Kim, In-Dong ; Chun, Tae-Won ; Kim, Heung-Geun ; Choi, Nam-Sup ; Choi, Jaeho
Author_Institution :
Dept. of Electr. Eng., Pukyong Nat. Univ., Busan, South Korea
Abstract :
A voltage disturbance generator for the test of a microgrid is described. The generator provides the function of voltage sag, unbalance, outage, and phase jump of the output voltage. The proposed generator has good features of high reliability, low cost, simple structure, high efficiency, and easy implementation. The main components of the generator are SCR thyristors and transformers, which provides reliable system. The circuit analysis and operating principle of the proposed scheme are described in each operating mode. The characteristics of the voltage and current in each mode are analyzed, and the usefulness of the scheme is verified through simulations.
Keywords :
power supply quality; microgrid; phase jump; voltage disturbance generator; voltage sag; Testing; Voltage; Miocrogrid; Phase-angle jump; Power quality; STS; Voltage sag;
Conference_Titel :
Power Electronics Conference (IPEC), 2010 International
Conference_Location :
Sapporo
Print_ISBN :
978-1-4244-5394-8
DOI :
10.1109/IPEC.2010.5543505