Title :
Design of dual-duplex system and evaluation of RAM
Author :
Kim, Hyunki ; Lee, Jungsuk ; Lee, Keyseo ; Lee, Hyuntae
Author_Institution :
Motorola Korea Design Center, Seoul, South Korea
Abstract :
We develop the dual-duplex system that detects a fault using a hardware comparator which switches to a hot standby redundancy. This system is designed on the basis of MC68000 and can be used in VMEbus. To improve the reliability and safety, the dual-duplex system is designed in double modular redundancy. The failure rate of the electrical element is calculated in MILSPEC-217F by RELEX6.0 tool, and the system RAMS (reliability, availability, maintainability, safety) and MTTF (mean time to failure) are designed by Markov modeling and evaluated by Matlab. Since the dual-duplex system has high reliability, availability, and safety, it can be applied to embedded control systems like airplanes and high-speed railway systems
Keywords :
Markov processes; fault tolerant computing; reliability theory; safety; software reliability; traffic engineering computing; MC68000; MILSPEC-217F; Markov modeling; RELEX 6 tool; availability; dual-duplex system; fault-tolerance; maintainability; mean time to failure; reliability; safety; stand-by system; Air safety; Availability; Electrical fault detection; Electrical safety; Hardware; Maintenance; Mathematical model; Railway safety; Redundancy; Switches;
Conference_Titel :
Intelligent Transportation Systems, 2001. Proceedings. 2001 IEEE
Conference_Location :
Oakland, CA
Print_ISBN :
0-7803-7194-1
DOI :
10.1109/ITSC.2001.948747
