Title :
Estimating tools to support multi-path agility in electronics manufacturing
Author :
Graves, Robert J. ; Agrawal, Ashutosh ; Haberle, Katharine
Author_Institution :
Electron. Agile Manuf. Res. Inst., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
Electronics manufacturing will increasingly require shorter cycle times for product development and manufacturing, lower volumes of identical items, increased customization, higher quality, and closer coupling among suppliers, customers and manufacturers. This trend is being driven by the demands of the global marketplace as customers demand newer, more compact, lower cost, and higher quality products in shorter concept-to-market intervals. This increased emphasis on achieving highly adaptive manufacturing to reduce manufacturing costs and to better utilize US manufacturing capacity over the future horizon has led to a critical focus on agile manufacturing as a strategy to achieve these goals. Methods for estimating production cost in different environments (along with a conceptual extension to cycle time) that exist in present day systems are discussed
Keywords :
costing; economics; manufacturing resources planning; printed circuit manufacture; product development; adaptive manufacturing; agile manufacturing; concept-to-market intervals; concurrent engineering; customization; cycle times; electronics manufacturing; estimating tools; functional testimg; in-circuit testing; manufacturing cost reduction; multi-path agility; printed circuit board; product development; production cost estimation; quality; repair analysis; resource planning; Agile manufacturing; Automotive engineering; Consumer electronics; Consumer products; Costs; Electronics packaging; Manufacturing industries; Product design; Product development; Production systems; Surface-mount technology;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2996-1
DOI :
10.1109/IEMT.1995.526088