Title :
Artificial neural networks for SPECT image reconstruction with optimized weighted backprojection
Author :
Floyd, C.E., Jr. ; Bowsher, J.E. ; Munley, M.T. ; Tourassi, G.D. ; Garg, Shelly ; Baydush, A.H. ; Lo, Joseph Y. ; Coleman, R.E.
Author_Institution :
Duke Univ., Durham, NC, USA
Abstract :
An artificial neural network has been developed to reconstruct quantitative single photon emission computed tomographic (SPECT) images. The network is trained using known projection-image pairs containing Poisson noise to learn a shift-invariant weighting (filter) which minimizes the mean squared error between the reconstructed image and the sample image. Once trained, the network produces a reconstructed image as its output when projection data are presented to its input. Supervised training with a modified delta rule was used to train this two-layer neural network having a backpropagation architecture with one hidden layer (the filtered projection). The system was trained for noise levels representative of 1000, 10k, and 1M counts per slice. The Fourier transform of the filtered projection (for an impulse function) is compared with the ramp filter used with backprojection.<>
Keywords :
computerised tomography; image reconstruction; medical image processing; radioisotope scanning and imaging; Fourier transform; Poisson noise; SPECT image reconstruction; artificial neural network; backpropagation architecture; filtered projection; impulse function; mean squared error minimization; medical diagnostic imaging; modified delta rule; nuclear medicine; optimized weighted backprojection; projection-image pairs; ramp filter; shift-invariant weighting; single photon emission computerized tomography; supervised training; Artificial neural networks; Backpropagation; Computer networks; Filters; Fourier transforms; Image reconstruction; Neural networks; Noise level; Optical computing; Single photon emission computed tomography;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1991., Conference Record of the 1991 IEEE
Conference_Location :
Santa Fe, NM, USA
Print_ISBN :
0-7803-0513-2
DOI :
10.1109/NSSMIC.1991.259306